TR8100LV
Designed for large and complex testing PCBAs, the TR8100LV is TRI's top-of-the-line board test system targeting the low-voltage testing market. TR8100LV's vacuum system ensures full pin contact and up to 3.584 MUX-free digital pin architecture, the system allows for faster and simpler testing of large pin-count devices and fast program development. Included *TRI ToggleScan® technology combines Boundary Scan with solutions for limited test access boards. *"ToggleScan®" are registered trademarks of Test Research, Inc.
Features
• Digital 1:1 driver/receiver per pin architecture design
• High fault coverage test solution with vacuum fixture
• Low voltage device testing and rapid test speed
• Friendly UI with fast and easy program development
Specifications
Tester Specifications
Analog/hybrid test pointsTR8100LV: 3584
TR8100LLV: 5632
Operating SystemMicrosoft® Windows compatible PC with USB, Windows 7-10
Fixture TypeOffline press or vacuum type fixture
Standard Testing Components
Analog Test Hardware
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6-wire measurement switching matrix
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Programmable AC/DC/DC High voltage and current sources
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AC/DC voltage, DC current measurement, frequency
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Component R/L/C measurement
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Synthesized Arbitrary Waveform Generator
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TestJet vectorless open circuit detection
Digital Testing
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Non-multiplexing 1:1 per pin architecture with independent per-pin level setting
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DUT power supplies: 5 V@5 A, 3.3 V@5 A, 12 V@5A, 0.2~20 V@3 A and -3~-20 V@3 A
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On-board Flash, EEPROM, MAC programming
Optional Components
Analog HardwareFixture Conversion Kits for Teradyne, GenRad
Digital Testing
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Programmable DUT power supplies: 75 V / 8 A, 200W maximum output power
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Includes BScan Chain Test, BScan Cluster Test, BScan Virtual Nails Test, BScan Virtual Chain Test and IEEE1149.6 Test
Yield Management SystemYMS 4.0
Dimensions
WxDxHTR8100LV: 1150 x 850 x 830 mm
TR8100LLV: 1550 x 850 x 830 mm
WeightTR8100LV: 390 kg
TR8100LLV: 450 kg
Downloads
