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ENCONTRE-NOS

Av. Alípio Octaviano de Souza Paraíso, 330 Sala 01  | Parque Residencial Paraíso
Itupeva/SP  CEP: 13.295-000

 

© 2018 Tekno-Sip | All rights reserved

Features

 • Digital 1:1 driver/receiver per pin architecture design
 • High fault coverage test solution with vacuum fixture
 • Low voltage device testing and rapid test speed
 • Friendly UI with fast and easy program development

Specifications

Tester Specifications

Analog/hybrid test pointsTR8100LV: 3584
TR8100LLV: 5632

Operating SystemMicrosoft® Windows compatible PC with USB, Windows 7-10

Fixture TypeOffline press or vacuum type fixture

Standard Testing Components

Analog Test Hardware

  • 6-wire measurement switching matrix

  • Programmable AC/DC/DC High voltage and current sources

  • AC/DC voltage, DC current measurement, frequency

  • Component R/L/C measurement

  • Synthesized Arbitrary Waveform Generator

  • TestJet vectorless open circuit detection

Digital Testing

  • Non-multiplexing 1:1 per pin architecture with independent per-pin level setting

  • DUT power supplies: 5 V@5 A, 3.3 V@5 A, 12 V@5A, 0.2~20 V@3 A and -3~-20 V@3 A

  • On-board Flash, EEPROM, MAC programming

 

Optional Components

Analog HardwareFixture Conversion Kits for Teradyne, GenRad

Digital Testing

  • Programmable DUT power supplies: 75 V / 8 A,  200W maximum output power

  • Includes BScan Chain Test, BScan Cluster Test, BScan Virtual Nails Test, BScan Virtual Chain Test and IEEE1149.6 Test

Yield Management SystemYMS 4.0

Dimensions

WxDxHTR8100LV: 1150 x 850 x 830 mm
TR8100LLV: 1550 x 850 x 830 mm

WeightTR8100LV: 390 kg
TR8100LLV: 450 kg

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